High-k Materials in Multi-Gate FET Devices

Cover of High-k Materials in Multi-Gate FET Devices by Shubham Tayal
Publisher: CRC Press
Year: 2023
Language: en
Edition: 1
Pages: 164
ISBN-13: 9780367639693
Dimensions:
Height: 9.21258 Inches
Length: 6.14172 Inches
Width: 0.4 Inches
Dewey Decimal: 537/.24
Editorial overview Touché

High-k Materials in Multi-Gate FET Devices by Shubham Tayal, published by CRC Press on September 25, 2023, is a comprehensive exploration of high-k materials in the context of advanced FET devices. This edition, consisting of 164 pages, delves into the engineering challenges and applications associated with high-k dielectrics, focusing on their role in enhancing the performance of multi-gate FETs at both the device and circuit levels.

Readers will find a thorough discussion on the fundamental aspects of FET devices, including the motivations behind multi-gate FETs and current trends in transistor technologies. The book addresses the fabrication and characterization of high-k materials, providing insights into their impact on gate-oxide and gate-sidewall spacers in emerging multi-gate FET architectures. It also outlines future research directions, making it a valuable resource for researchers in materials science, electronics engineering, and semiconductor device modeling, particularly those interested in nanodevices like FinFET and Tunnel FET.


Official synopsis Publisher

High-k Materials in Multi-Gate FET Devices focuses on high-k materials for advanced FET devices. It discusses emerging challenges in the engineering and applications and considers issues with associated technologies. It covers the various way of utilizing high-k dielectrics in multi-gate FETs for enhancing their performance at the device as well as circuit level.

  • Provides basic knowledge about FET devices
  • Presents the motivation behind multi-gate FETs, including current and future trends in transistor technologies
  • Discusses fabrication and characterization of high-k materials
  • Contains a comprehensive analysis of the impact of high-k dielectrics utilized in the gate-oxide and the gate-sidewall spacers on the GIDL of emerging multi-gate FET architectures
  • Offers detailed application of high-k materials for advanced FET devices
  • Considers future research directions

This book is of value to researchers in materials science, electronics engineering, semiconductor device modeling, IT, and related disciplines studying nanodevices such as FinFET and Tunnel FET and device-circuit codesign issues.

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This page includes the available description and bibliographic details for “High-k Materials in Multi-Gate FET Devices” by Shubham Tayal. Synopsis preview: High-k Materials in Multi-Gate FET Devices focuses on high-k materials for advanced FET devices. It discusses emerging challenges in the engineering and applications and considers issues with associated technologies. It…
Who is the author of “High-k Materials in Multi-Gate FET Devices”?
“High-k Materials in Multi-Gate FET Devices” is credited to Shubham Tayal.
When was “High-k Materials in Multi-Gate FET Devices” published?
Publisher: CRC Press. Year: 2023.
What is the ISBN for “High-k Materials in Multi-Gate FET Devices”?
ISBN-13: 9780367639693.
What are the book details (language, pages, edition)?
Language: en. Pages: 164. Edition: 1.

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