Scaling Effects on Metal-oxide-semiconductor Device Characteristics
“Scaling Effects on Metal-oxide-semiconductor Device Characteristics” by Steven Walstra is a scholarly work published by Dissertation Discovery Company, LLC on May 31, 2019. This edition comprises 152 pages and is presented in English. The dissertation explores the characteristics of metal-oxide-semiconductor devices, focusing on the scaling effects that influence their performance and functionality.
Readers will find a comprehensive examination of the subject matter, as the content remains unaltered from its original form obtained from the University of Florida. The formatting has been modified solely to enhance readability and printing convenience. This work is relevant to those interested in technology and engineering, particularly within the electrical domain, providing insights into the intricacies of semiconductor device characteristics.
Official synopsis Publisher
Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, “Scaling Effects on Metal-oxide-semiconductor Device Characteristics” by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university’s institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.
Publisher
Topics
FAQ
What is “Scaling Effects on Metal-oxide-semiconductor Device Characteristics” about?
Who is the author of “Scaling Effects on Metal-oxide-semiconductor Device Characteristics”?
When was “Scaling Effects on Metal-oxide-semiconductor Device Characteristics” published?
What is the ISBN for “Scaling Effects on Metal-oxide-semiconductor Device Characteristics”?
What are the book details (language, pages, edition)?
