Surface Analysis of Polymers by XPS and Static SIMS

Surface Analysis of Polymers by XPS and Static SIMS, authored by D. Briggs and published by Cambridge University Press on April 2, 1998, offers a comprehensive exploration of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a focus on polymeric materials. This edition spans 198 pages and is presented in English, providing readers with a detailed examination of the instrumentation, physical principles, and applications of these advanced analytical techniques.

Readers will find that this book delves into the capabilities of XPS and SSIMS, detailing the types of information these methods can yield in the analysis of polymer surfaces. The text includes case studies that highlight the complementary use of both techniques in understanding polymer surface structure and its implications for material properties. This resource is designed for academic and industrial researchers engaged in the fields of science, technology, and engineering, particularly those focused on materials science and polymer analysis.