Mutation Testing for the New Century
Mutation Testing for the New Century by W. Eric Wong is a comprehensive resource published by Springer US on December 7, 2010. This softcover reprint of the original 1st edition from 2001 spans 118 pages and is presented in English. The book focuses on the advancements in mutation testing, detailing the development of mutation tools for programming languages such as Fortran, Ada, C, and IDL, along with empirical evaluations that compare mutation with other testing criteria.
Readers will find a collection of cutting-edge research results that address key questions in mutation testing while also raising new inquiries. The text discusses the coupling effect and presents techniques for enhancing the efficiency of mutation testing through high-performance architectures. This edition serves as a valuable reference for researchers, practitioners, and students involved in software development and engineering, particularly in the realms of information technology and programming.
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Extensive research and development has produce mutation tools for languages such as Fortran, Ada, C, and IDL; empirical evaluations comparing mutation with other test adequacy criteria; empirical evidence and theoretical justification for the coupling effect; and techniques for speeding up mutation testing using various types of high performance architectures. Mutation has received the attention of software developers and testers in such diverse areas as network protocols and nuclear simulation.
Mutation Testing for the New Century brings together cutting edge research results in mutation testing from a wide range of researchers. This book provides answers to key questions related to mutation and raises questions yet to be answered. It is an excellent resource for researchers, practitioners, and students of software engineering.
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