Authors: Gianfranco Pacchioni
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![Defects in SiO2 and Related Dielectrics: Science and Technology Science and Technology ; [proceedings of the NATO Advanced Study Institute on Defects in SiO 2 and Related Dielectrics: Science and Technolgy, Erice, Italy, April 8 – 20, 2000] — Gianfranco Pacchioni](https://en.touchelivros.com.br/wp-content/uploads/2026/04/defects-in-sio2-and-related-dielectrics-science-and-technology-science-and-technology-proceedings-of-the-nato-advanced-s-jpg.jpg)
Defects in SiO2 and Related Dielectrics: Science and Technology Science and Technology ; [proceedings of the NATO Advanced Study Institute on Defects in SiO 2 and Related Dielectrics: Science and Technolgy, Erice, Italy, April 8 – 20, 2000] — Gianfranco Pacchioni