Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio, published by Springer US in November 2009, offers a comprehensive examination of testing and diagnostics in modern electronics. This edition, comprising 171 pages, addresses the challenges posed by nanoscaled technologies, particularly focusing on SRAM memory, which is increasingly susceptible to defects due to high density demands.
Readers will find detailed discussions on the limitations of classical testing methods that primarily address static faults, highlighting the necessity for new approaches to tackle dynamic faults emerging in Very Deep Sub-Micron technologies. The book presents dedicated test sequences designed to effectively identify these dynamic faults, making it a valuable resource for professionals in technology and engineering, especially those involved in electronics and circuit design.
Official synopsis Publisher
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called “static faults,” but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as “dynamic faults”, are not covered by classical test solutions and require the dedicated test sequences presented in this book.
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