Microelectronics Manufacturing Diagnostics Handbook

Cover of Microelectronics Manufacturing Diagnostics Handbook by Abraham Landzberg
Publisher: Springer US
Year: 2012
Language: en
Edition: 1993
Pages: 633
ISBN-13: 9781461358404
Dimensions:
Height: 10 Inches
Length: 7.01 Inches
Weight: 2.77561987858 Pounds
Width: 1.52 Inches
Dewey Decimal: 670
Editorial overview Touché

Microelectronics Manufacturing Diagnostics Handbook by Abraham Landzberg, published by Springer US on November 5, 2012, is a comprehensive resource that explores the intricacies of microelectronics manufacturing. This edition, spanning 633 pages, delves into measurement systems, diagnostics, and failure analysis, highlighting the significance of semi-control techniques in enhancing manufacturing processes. The book presents methods for modeling conductors used in desktop computers and their applications in various industries, including automotive, emphasizing the importance of defect reduction and high-quality diagnostics.

Readers will find detailed discussions on the methodologies that improve yield and reliability in manufacturing, making the content applicable to processes of similar complexity beyond microelectronics. The text addresses the challenges of defect reduction and the advancements that have been made in cost and reliability, providing insights from leading experts in the field. This handbook serves as a valuable reference for professionals seeking to understand the critical role of diagnostics in modern manufacturing and the continuous improvement of product performance.


Official synopsis Publisher

The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per and reducing defects, and for preventing de formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re of Technology Products General Manager duction in the microelectronics world.

FAQ
What is “Microelectronics Manufacturing Diagnostics Handbook” about?
This page includes the available description and bibliographic details for “Microelectronics Manufacturing Diagnostics Handbook” by Abraham Landzberg. Synopsis preview: The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi control techniques, test, diagnostics, and fail ure analysis. It discusses methods for mod…
Who is the author of “Microelectronics Manufacturing Diagnostics Handbook”?
“Microelectronics Manufacturing Diagnostics Handbook” is credited to Abraham Landzberg.
When was “Microelectronics Manufacturing Diagnostics Handbook” published?
Publisher: Springer US. Year: 2012.
What is the ISBN for “Microelectronics Manufacturing Diagnostics Handbook”?
ISBN-13: 9781461358404.
What are the book details (language, pages, edition)?
Language: en. Pages: 633. Edition: 1993.

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