Nanometrology Using the Transmission Electron Microscope
“Nanometrology Using the Transmission Electron Microscope” by Vlad Stolojan is a practical guide published by Morgan & Claypool Publishers in 2015. This 68-page book is written in English and focuses on the capabilities of the Transmission Electron Microscope (TEM) as a vital instrument for observing and measuring nanoscale structures. It highlights recent technological advancements that enhance our understanding of materials and discusses the TEM’s potential applications in studying biological and biomolecular systems.
Readers will find detailed insights into how the TEM can be utilized to investigate physical and chemical phenomena at the nanoscale, including its ability to probe elemental composition and electronic structure with sub-nanometer resolution. The book addresses key topics such as scientific instruments and measurement, making it a valuable resource for scientists seeking to leverage the TEM in their research. This edition serves as a comprehensive reference for those interested in the intersection of technology and engineering within the realm of nanometrology.
Official synopsis Publisher
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
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