Focused Beam Methods Measuring Microwave Materials in Free Space
Focused Beam Methods Measuring Microwave Materials in Free Space by John W. Schultz, published by John Schultz on October 15, 2012, is a comprehensive resource that explores the intrinsic microwave properties of materials. Spanning 142 pages, this book addresses various applications, including antenna and electronic circuit design, remote sensing, and electromagnetic interference mitigation. It provides an overview of established methods for characterizing materials at microwave frequencies, emphasizing the growing use of free-space measurement techniques in laboratories due to their practicality and accuracy.
Readers will find detailed discussions on the theory and practice of microwave focused beam systems for free-space characterization. The book covers a range of methods, including transmission lines, resonant cavities, and impedance analysis, while highlighting the effectiveness of free-space techniques for materials characterization from 2 GHz to millimeter waves. This edition serves as a valuable guide for engineers and scientists looking to deepen their understanding of microwave technology and its applications in engineering and technology.
Official synopsis Publisher
Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.
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